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Function
Standalone Type
For Microscope
Cleanliness Inspection System
APIS (Automated Particle Inspection System, Cleanliness Testing System) is collected Particle Contamination (particle pollution) and ease of impurities and accurately measurable system from the Membrane Filter.
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The need for an inspection system cleanliness
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Particle Contamination (particle pollution) measurement has developed into the most important skills across all areas of the manufacturing industry
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Particle analysis and prevention of harmful ingredients to scarcity (particles) can have a devastating effect on the human body and machines
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There is a need for particle pollution, easy and accurate measurements possible impurities collected from domestic system Membrane Filter is increasing
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